Sparrow MTS 30

In-Circuit Test System

Digitaltest In-Circuit Test System Parallel Test

19 inch In-Circuit Test System

The Sparrow offers maximum flexibility and test capability in a small footprint.

Up to 1,152 pins
19 inch – easy integration into a standard rack
Very small footprint
Fast Access Interface (FAI) – quick exchange interface for easy maintenance
Real parallel test: easy implemention of Lambda edition

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The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.

In spite of its small footprint the Sparrow features 9 slots for module cards with up to 1,152 test pins, which are available as analog or hybrid pins or even a combination of the two. In addition, the benchtop tester can accommodate up to four programmable power supplies. With the proven In-Circuit and functional test modules you can handle a majority of the possible test scenarios simply and economically.

Features

Maximum no. of networks	1,152
Maximum board size (mm)	Unlimited
Interface	Cable
System size (LxWxD)	483 x 178 x 5,700
Format	19" housing, flexible
Possible versions	analog, hybrid & Lambda edition
Maximum fixture pin number	1,152

Link between CAD, test and repair

Fast Access Interface (FAI)

You can equip our Sparrow with a quick-change interface, the so-called Fast Access Interface (FAI). This gives you quick and simple access to the pin cards without cumbersome plugging and unplugging of the flat cables. You save time with maintenance, for example: simply fold the slot cover over to the side – either to the left or right – and remove the pin card.

External switch for vacuum adapter

The external vacuum switch allows you to control a vacuum adapter directly through the Sparrow. This is a box which is connected to the rear of the In-Circuit tester. Use the VacOn or VacOff commands to enable or disable the vacuum switch.

Functional test tower

Are you looking for a flexible system with standard interface for your functional test? You’re not alone. Which is why we also offer our 19“ Sparrow as a functional test tower with standardized pylon interface. In addition to the pins for In-Circuit testing and functional testing, this can also include blocks for high voltage/current, pneumatic terminals or glass fiber optics. The tower can be individually configured and can accommodate additional IEEE- or PXI-based functional test equipment.

Our engineers will be happy to design similar integrations on request and with the support of our integration specialist partners.

Power Supply Rack

If the four power supplies on the Sparrow are not enough, we offer a Power Supply Rack with twelve additional power supplies. Like the benchtop tester, this is for a 19“ rack and allows you to install additional UPC modules. Multiple panels, different voltages or parallel testing of more complex test objects are then no problem with our compact test system.

In-Circuit Test

AMU05

Analog Measurement Unit – heart of the system

The AMU05 (Analog Measurement Unit 05) is the core of all our test systems. It ensures that all the measurements are performed faster, more accurately and with even greater stability.

Improves the quality of your test programs

When it comes to the test coverage of a program in the analog ICT, the question is not only whether there is a test for every component and if it was performed, but also whether the test would in fact recognize a fault.

Switching matrix

The Analog Signal Switch Unit serves as a 6-bus interconnect for 128 pins each to the Analog Measurement Unit (AMU05) for the In-Circuit test.

128-Pin hybrid driver/sensor module

The HYB04 enables comprehensive analog as well as digital driver- and sensor-functions. It has 128 non-multiplexed hybrid pins per module.

64-pin hybrid driver/sensor module

Our HYB03 enables comprehensive analog as well as digital driver- and sensor-functions. It has 64 non-multiplexed hybrid pins per module.

UCB

Our universal carrier for function modules

All function modules are plugged into our Universal Carrier Board (UCB) – with four slots available per carrier.

Measures frequencies and times

The MTC is responsible for measuring frequencies and times.

Universal control outputs

The MOC is our universal control module for a wide variety of tasks, such as controlling relays in the fixture.

Relays for free circuits

Our MRM is a relay card for universal connection of many kinds of signals. It serves as a basic module and is available as a variant with 16 NO relays or as a variant with 4 x (7:1) multiplex structure.

Programmable resistor

The MRD permits connection of a programmable resistor to the test object.

Stimulate and measure voltages and currents

The MSM measures and stimulates precise voltages and currents through the six bus lines or interface pins.

Potential-free voltage source

The Universal Power Controller (UPC02) provides an independent potential-free voltage source for powering the test object, whereby the output voltage and current limiting are freely programmable.

Lambda edition: real parallel testing as the solution

Would you like to test multiple boards in parallel and save time? We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

Optimizes cycle times
Small, economical test heads
Powerful, flexible software environment
Assemblies can be tested without additional effort
Low hardware costs
Takes up less space

Learn more about our Lambda edition.

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

Learn more

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.

IEEE-, RS232-, USB-Modules

These functional modules have standardized PC interfaces for communicating with additional function test modules.

PXI Devices

PXI devices serve as expansion modules for specific tests.

Optical Test Modules

The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.

Ideal for

inline handlers (board and fixture), since the device is small and compact.
basically any interface is possible using a fixture adapter (e.g. Pylon or Virginia Panel)

In order to avoid long waiting times for the construction of the fixtures, Digitaltest offers an in-house fixture service.

Go to Digitaltest Fixture Service