Sparrow MTS 30

In-Circuit Testsystem

Bench Top Tester

The Sparrow provides the highest level of flexibility and test capability in a small footprint.

  • Up to 1,152 pins
  • Small footprint – 19 inch portable rack
  • Highly flexible test system
  • Simple integration into in-line systems and / or 19 inch racks
  • Fast access interface (FAI) for easy maintenance

The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.

In spite of its small footprint the Sparrow features 9 slots for module cards with up to 1152 test pins, which are available as analog or hybrid pins or even a combination of the two. In addition, the benchtop tester can accommodate up to four programmable power supplies. With the proven In-Circuit and functional test modules you can handle a majority of the possible test scenarios simply and economically.

Features

Maximum no. of networks 1152
Maximum board size (LxWxD) Unlimited
Interface Cable
System size (LxWxD) 483 x 178 x 5700
Format 19" housing, flexible
Possible versions analog, hybrid & Lambda edition
Maximum fixture pin number 1152

Fast Access Interface (FAI)

You can equip our Sparrow with a quick-change interface, the so-called Fast Access Interface (FAI). This gives you quick and simple access to the pin cards without cumbersome plugging and unplugging of the flat cables. You save time with maintenance, for example: simply fold the slot cover over to the side – either to the left or right – and remove the pin card.

External switch for vacuum adapter

The external vacuum switch allows you to control a vacuum adapter directly through the Sparrow. This is a box which is connected to the rear of the In-Circuit tester. Use the VacOn or VacOff commands to enable or disable the vacuum switch.

Functional test tower

Are you looking for a flexible system with standard interface for your functional test? You’re not alone. Which is why we also offer our 19“ Sparrow as a functional test tower with standardized pylon interface. In addition to the pins for In-Circuit testing and functional testing, this can also include blocks for high voltage/current, pneumatic terminals or glass fiber optics. The tower can be individually configured and can accommodate additional IEEE- or PXI-based functional test equipment.

Our engineers will be happy to design similar integrations on request and with the support of our integration specialist partners.

Power Supply Rack

If the four power supplies on the Sparrow are not enough, we offer a Power Supply Rack with twelve additional power supplies. Like the benchtop tester, this is for a 19“ rack and allows you to install additional UPC modules. Multiple panels, different voltages or parallel testing of more complex test objects are then no problem with our compact test system.

In-Circuit Test

Functional test

Lambda edition: real parallel testing as the solution

We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda Edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

  • Optimizes cycle times
  • Small, economical test heads
  • Powerful, flexible software Environment
  • Assemblies can be tested without additional effort
  • Low hardware costs
  • Takes up less space

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

  • Reduces fixture costs by saving test points
  • Just one test fixture needed for boundary scan and ICT
  • Increases test coverage by integrating all test channels
  • Short test times by integrating with Digitaltest hybrid cards
  • Incorporates all functions in CITE - production remains in the familiar user Interface
  • Simple data export with C-LINK DTM for boundary scan software

Our main partners in matters of JTAG/Boundary Scan integration are the respected GÖPEL electronic and JTAG Technologies.

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.

IEEE-, R232-, USB-Modules

These functional modules have standardized PC interfaces for communicating with additional function test modules.

PXI Devices

PXI devices serve as expansion modules for specific tests.

Optical Test Modules

The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.

Ideal for

  • inline handlers (board and fixture), since the device is small and compact.
  • basically any interface is possible using a fixture adapter (e.g. Pylon or Virginia Panel)

You want to know more about our products?

Please contact us