Omega MTS 888

In-Circuit Testsystem

High Performance Tester

The Omega is our high performance tester, with the highest test pin count.

  • Up to 7,040 pins
  • Ergonomic handling
  • Saves time to market: the fixture build can start while test program is being generated

Our highly ergonomic Omega MTS 888 offers not only a healthy workstation but also an extremely high-performance test system with 7040 test pins. Here we have developed a height-adjustable and tiltable high-performance tester that allows you to construct the fixture even while the test program is being developed.

Since each channel can be assigned to its own logic family, fixture construction is made much simpler. The in-circuit tester can also be configured as a functional tester. Here simply use our various modules, such as the frequency-time measuring unit, analog in-/output, or voltage sources.

Features

Maximum no. of networks 7040
Maximum board size (LxWxD) Unlimited
Interface Vacuum or cable
System size (LxWxD) 1500 x 860 up to 1060 (adjustable) x 750
Format High pin count, high-performance tester, ergonomic
Possible versions analog, hybrid & Lambda edition
Maximum fixture pin number 7040

In-Circuit Test

Functional test

Lambda edition: real parallel testing as the solution

We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda Edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

  • Optimizes cycle times
  • Small, economical test heads
  • Powerful, flexible software Environment
  • Assemblies can be tested without additional effort
  • Low hardware costs
  • Takes up less space

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

  • Reduces fixture costs by saving test points
  • Just one test fixture needed for boundary scan and ICT
  • Increases test coverage by integrating all test channels
  • Short test times by integrating with Digitaltest hybrid cards
  • Incorporates all functions in CITE - production remains in the familiar user Interface
  • Simple data export with C-LINK DTM for boundary scan software

Our main partners in matters of JTAG/Boundary Scan integration are the respected GÖPEL electronic and JTAG Technologies.

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.

IEEE-, R232-, USB-Modules

These functional modules have standardized PC interfaces for communicating with additional function test modules.

PXI Devices

PXI devices serve as expansion modules for specific tests.

Optical Test Modules

The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.

Ideal for

  • Includes a pneumatic fixture placement aid
  • Basically any interface is possible using a fixture converter (e.g. Pylon or Virginia Panel)

You want to know more about our products?

Please contact us