Omega MTS 888

In-Circuit Test System

High Performance In-Circuit Tester

The Omega is our high performance tester, which offers the highest number of test pins.

Up to 7,040 pins
Swiveling interface for ergonomic Operation
Pneumatic fixture lowering
Short measuring paths

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Product Flyer Omega MTS 888 (A4 Format)
Product Flyer Omega MTS 888 (Lettersize Fomat)
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Our highly ergonomic Omega MTS 888 offers not only a healthy workstation but also an extremely high-performance test system with 7040 test pins. Here we have developed a height-adjustable and tiltable high-performance tester that allows you to construct the fixture even while the test program is being developed.

Since each channel can be assigned to its own logic family, fixture construction is made much simpler. The in-circuit tester can also be configured as a functional tester. Here simply use our various modules, such as the frequency-time measuring unit, analog in-/output, or voltage sources.

Features

Maximum no. of networks	7040
Maximum board size (mm)	Unlimited
Interface	Vacuum or cable
System size (LxWxD)	1500 x 860 up to 1060 (adjustable) x 750
Format	High pin count, high-performance tester, ergonomic
Possible versions	analog, hybrid & Lambda edition
Maximum fixture pin number	7040

Link between CAD, test and repair

AMU05

Analog Measurement Unit – heart of the system

The AMU05 (Analog Measurement Unit 05) is the core of all our test systems. It ensures that all the measurements are performed faster, more accurately and with even greater stability.

Improves the quality of your test programs

When it comes to the test coverage of a program in the analog ICT, the question is not only whether there is a test for every component and if it was performed, but also whether the test would in fact recognize a fault.

Switching matrix

The Analog Signal Switch Unit serves as a 6-bus interconnect for 128 pins each to the Analog Measurement Unit (AMU05) for the In-Circuit test.

128-Pin hybrid driver/sensor module

The HYB04 enables comprehensive analog as well as digital driver- and sensor-functions. It has 128 non-multiplexed hybrid pins per module.

64-pin hybrid driver/sensor module

Our HYB03 enables comprehensive analog as well as digital driver- and sensor-functions. It has 64 non-multiplexed hybrid pins per module.

UCB

Our universal carrier for function modules

All function modules are plugged into our Universal Carrier Board (UCB) – with four slots available per carrier.

Measures frequencies and times

The MTC is responsible for measuring frequencies and times.

Universal control outputs

The MOC is our universal control module for a wide variety of tasks, such as controlling relays in the fixture.

Relays for free circuits

Our MRM is a relay card for universal connection of many kinds of signals. It serves as a basic module and is available as a variant with 16 NO relays or as a variant with 4 x (7:1) multiplex structure.

Programmable resistor

The MRD permits connection of a programmable resistor to the test object.

Stimulate and measure voltages and currents

The MSM measures and stimulates precise voltages and currents through the six bus lines or interface pins.

Potential-free voltage source

The Universal Power Controller (UPC02) provides an independent potential-free voltage source for powering the test object, whereby the output voltage and current limiting are freely programmable.

Lambda edition: real parallel testing as the solution

Would you like to test multiple boards in parallel and save time? We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.

The Lambda edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.

Advantages of parallel testing

Optimizes cycle times
Small, economical test heads
Powerful, flexible software environment
Assemblies can be tested without additional effort
Low hardware costs
Takes up less space

Learn more about our Lambda edition.

Boundary Scan ICT

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

Learn more

CAN-/LIN-Modules

The CAN-/LIN modules are standard interfaces for communication with the test object.

Programmer Modules

With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.