In-Circuit Test System
Omega MTS 888
Our highly ergonomic Omega MTS 888 offers not only a healthy workstation but also an extremely high-performance test system with 7040 test pins. Here we have developed a height-adjustable and tiltable high-performance tester that allows you to construct the fixture even while the test program is being developed.
Since each channel can be assigned to its own logic family, fixture construction is made much simpler. The in-circuit tester can also be configured as a functional tester. Here simply use our various modules, such as the frequency-time measuring unit, analog in-/output, or voltage sources.
|Maximum no. of networks||7040|
|Maximum board size (mm)||Unlimited|
|Interface||Vacuum or cable|
|System size (LxWxD)||1500 x 860 up to 1060 (adjustable) x 750|
|Format||High pin count, high-performance tester, ergonomic|
|Possible versions||analog, hybrid & Lambda edition|
|Maximum fixture pin number||7040|
Our universal carrier for function modules
All function modules are plugged into our Universal Carrier Board (UCB) – with four slots available per carrier.
Universal control outputs
The MOC is our universal control module for a wide variety of tasks, such as controlling relays in the fixture.
Relays for free circuits
Our MRM is a relay card for universal connection of many kinds of signals.
The MRD permits connection of a programmable resistor to the test object.
Stimulate and measure voltages and currents
The MSM measures and stimulates precise voltages and currents through the six bus lines or interface pins.
Potential-free voltage source
The Universal Power Controller (UPC02) provides an independent potential-free voltage source for powering the test object, whereby the output voltage and current limiting are freely programmable.
Lambda edition: real parallel testing as the solution
Would you like to test multiple boards in parallel and save time? We have the solution: real parallel testing with the Lambda edition. With this technology you can test two or more assemblies at the same time, thereby optimizing the cycle times and shortening the test time or performing the tests using the shortest path. An ICT or functional test is performed by two or more independent test heads, reducing the test time by the corresponding factor. This applies to multi-panels as well as for multiple independent single test objects.
The Lambda edition thus reduces the test time for two objects for example by 50 percent, or 75 percent for four, and so on.
Advantages of parallel testing
- Optimizes cycle times
- Small, economical test heads
- Powerful, flexible software environment
- Assemblies can be tested without additional effort
- Low hardware costs
- Takes up less space
Boundary Scan ICT
With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.
The CAN-/LIN modules are standard interfaces for communication with the test object.
With the Programmer Modules you can make specific selections for onboard flash programming. Here we integrate for example programmers from Ertec, SMH, ProMik or Algocraft.
IEEE-, RS232-, USB-Modules
These functional modules have standardized PC interfaces for communicating with additional function test modules.
PXI devices serve as expansion modules for specific tests.
Optical Test Modules
The modules for optical tests can for example test LEDs, with fiber optic cables used for testing the color and intensity of LEDs.