Digitaltest at Productronica 2019
At this year's Productronica from 12th to 15th November 2019 in Munich, we and our sales partner WIT will present Complete Optical Repair Solutions (CORS), an extension of our QMAN software in combination with an optical component inspection on the IP-3000. Furthermore we will show CITE 8.0, the latest version of our operating software, inform about news about C-LINK and present the Lambda edition of the Sparrow MTS 30 with fixture construction in our own in-house production.
The procedure for troubleshooting in the past:
The error on an electronic board had to be searched and identified manually using a magnifying glass. The procedure was and still is time-consuming, especially in view of the increasing miniaturization and high packing density.
Digitaltest's solution for the future is Complete Optical Repair Solution (CORS):
The IP-3000 optical inspection system is remotely controlled via the QMAN Repair Stations software and now displays the fault location as a live image on a high-resolution monitor. This means a much faster fault analysis and easier repair, which will eventually save time and money. QMAN imports the test results from various test processes. In the event of a fault, the defective assembly can be quickly repaired with the help of QMAN. The solution lies in the camera system of the IP-3000 inspection system: the connected side cameras enable solder joint inspection and the detection of short circuits.
The advantages are obvious:
- Simple localization of assembly faults
- Live image enables faster analysis & repair
- Repair instead of disposal: Reduction of rejects
- Cost saving of resources & protection of the environment
More throughput as fast as possible:
Additionally we show the Lambda edition of the Sparrow MTS 30, a parallel tester whose fixture was manufactured by our own fixture house in Cairo. With the the Lambda edition you can simultaneously test two or more boards, therefore optimizing cycle times and increase throughput. This applies both to panelization and to several independent individual devices under test (DUTs).