Digitaltest GmbH

CITE

System software

CITE 7 is the current software for all our test systems – so that you can generate test programs quickly and simply

  • Reduces test program generation effort
  • Shortens introduction time for new products (NPI)
  • Simple generating and debugging of test programs
  • GenFast enables test program generation without requiring programming Knowledge
  • Programmable in Visual Studio (VB 6/VB .NET)
  • Highly user friendly, e.g. drag and drop
  • Generates a test program from the assembly description using Automatic Program Generator (APG)
  • Simple generation and managing of board assembly variations

Downloads

System software

CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest systems. It is a real-time system offering numerous tools for ensuring high test quality and shortening the testing time. With this software you can use Visual Basic, table-based GenFast or a combination of the two to generate and debug test programs quickly and simply.

Test program generation

  • Automatic Program Generator (APG) creates the test program from the assembly description
  • Library for analog and digital In-Circuit tests
  • Simple variant handling
  • Programming in Visual Basic (VB 6, VB .NET) and/or table-based GenFast
  • Translation of test programs from any common test system
  • Recording of all test results for traceability

Test program debugging

  • Powerful debugging with GenFast and all functions from VB .NET
  • Single-step mode available
  • Debug window for displaying measurement results
  • Command parameters can be changed and the effects made directly visible
  • Simplified debugging with layout/schematic diagram viewer (optional) and highlighting of defective components
  • Any change in the status of the test program can be coupled with an action, e.g. after releasing a test program a current backup can be created and saved with the date and time

GenFast – table-based test program generation

  • Program generation without knowledge of a programming language
  • Easy to edit tabular structure
  • Comprehensive configuration options
  • Target changing of values
  • Statistical evaluation of all analog In-Circuit tests

Self-test

  • Checks the hardware and localizes defective modules
  • Diagnostics on the relay level
  • Current self-test can be retrieved in the Customer Portal

Backup- and Restore Center

  • Saves a backup of the test program
  • Packs all the data from a test program including C-LINK Test Job in an archive
  • Files from the test program can be placed in various folders or on computers
  • The packed archives help our experts in troubleshooting

Debugger Robot – automatic test program debugging

  • Debugs and stabilizes test programs
  • Flexibly configurable
  • Automatic guarding
  • Automatically learns non-debuggable Tests
  • Corrects incorrect polarities of diodes and Transistors
  • Combines parallel capacitors across low-resistance components
  • Processing duration 15-20 minutes
  • Test program percentage of completion up to 80-100%

Test stability report QCAM

  • Evaluation of all measurement values (MDL data)
  • Provides test program quality and stability Reports
  • Enables simple and efficient debugging

Test Coverage Report

  • Evaluates and quality of the test program
  • Checks test coverage
  • Results available in table form or optionally as a graphic display in the schematic diagram viewer

Test program Import

  • Translates test program from obsolete CITE versions in VB 6
  • Brings CITE commands from test programs from VB 6 to VB .NET

Measurement value statistics QCAM2

  • Evaluates all measurement values including data in the new MDL Format
  • Shows the evaluation of average, standard deviation and CpK (process capability index)
  • Offers expanded filtering functions

Table-based measurement value statistics MDL2SPC

  • Imports MDL data in the new format as an Excel file
  • Contains logic checks – only comparable measurements are actually compared
  • Calculates and evaluates average, standard deviations and CpK/CP (process capability index)
  • Enables individual calculations, evaluations and graphics

Callback function

  • Enables simple programming of responses to the test result directly following a measurement – the test program does not have to be closed
  • Example: if a pin error reoccurs 20 times, an e-mail is sent to maintenance

You want to know more about our software?

Please contact us