CITE 7 is the current software for all our test systems – so that you can generate test programs quickly and simply
- Reduces test program generation effort
- Shortens introduction time for new products (NPI)
- Simple generating and debugging of test programs
- GenFast enables test program generation without requiring programming Knowledge
- Programmable in Visual Studio (VB 6/VB .NET)
- Highly user friendly, e.g. drag and drop
- Generates a test program from the assembly description using Automatic Program Generator (APG)
- Simple generation and managing of board assembly variations
System software
CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest systems. It is a real-time system offering numerous tools for ensuring high test quality and shortening the testing time. With this software you can use Visual Basic, table-based GenFast or a combination of the two to generate and debug test programs quickly and simply.
Test program generation
- Automatic Program Generator (APG) creates the test program from the assembly description
- Library for analog and digital In-Circuit tests
- Simple variant handling
- Programming in Visual Basic (VB 6, VB .NET) and/or table-based GenFast
- Translation of test programs from any common test system
- Recording of all test results for traceability
Test program debugging
- Powerful debugging with GenFast and all functions from VB .NET
- Single-step mode available
- Debug window for displaying measurement results
- Command parameters can be changed and the effects made directly visible
- Simplified debugging with layout/schematic diagram viewer (optional) and highlighting of defective components
- Any change in the status of the test program can be coupled with an action, e.g. after releasing a test program a current backup can be created and saved with the date and time
Self-test
- Checks the hardware and localizes defective modules
- Diagnostics on the relay level
- Current self-test can be retrieved in the Customer Portal
Debugger Robot – automatic test program debugging
- Debugs and stabilizes test programs
- Flexibly configurable
- Automatic guarding
- Automatically learns non-debuggable Tests
- Corrects incorrect polarities of diodes and Transistors
- Combines parallel capacitors across low-resistance components
- Processing duration 15-20 minutes
- Test program percentage of completion up to 80-100%
Test stability report QCAM
- Evaluation of all measurement values (MDL data)
- Provides test program quality and stability Reports
- Enables simple and efficient debugging
Test Coverage Report
- Evaluates and quality of the test program
- Checks test coverage
- Results available in table form or optionally as a graphic display in the schematic diagram viewer
Test program Import
- Translates test program from obsolete CITE versions in VB 6
- Brings CITE commands from test programs from VB 6 to VB .NET
Measurement value statistics QCAM2
- Evaluates all measurement values including data in the new MDL Format
- Shows the evaluation of average, standard deviation and CpK (process capability index)
- Offers expanded filtering functions
Table-based measurement value statistics MDL2SPC
- Imports MDL data in the new format as an Excel file
- Contains logic checks – only comparable measurements are actually compared
- Calculates and evaluates average, standard deviations and CpK/CP (process capability index)
- Enables individual calculations, evaluations and graphics
