Boundary Scan for In-Circuit tests

 

With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.

  • Reduces fixture costs by saving test points
  • Just one test fixture needed for boundary scan and ICT
  • Increases test coverage by integrating all test channels
  • Short test times by integrating with Digitaltest hybrid cards
  • Incorporates all functions in CITE - production remains in the familiar user Interface
  • Simple data export with C-LINK DTM for boundary scan software

Our main partners in matters of JTAG/Boundary Scan integration are the respected GĂ–PEL electronic and JTAG Technologies.

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