With our boundary scan upgrade for In-Circuit Tests (ICT) you can get the best of both testing methods worlds and achieve an optimal test strategy with maximum test coverage and reduced overall costs.
Reduces fixture costs by saving test points
Just one test fixture needed for boundary scan and ICT
Increases test coverage by integrating all test channels
Short test times by integrating with Digitaltest hybrid cards
Incorporates all functions in CITE - production remains in the familiar user Interface
Simple data export with C-LINK DTM for boundary scan software
