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Online lecture by Digitaltest: In-circuit test versus functional test

On February 9th, Ebeid Safein, Applications Manager of Digitaltest Inc., will talk about the different approaches, challenges and possible combinations of in-circuit and functional testing at the online event "Ohio Chapter Meeting: Test/-Design for Testability" organised by the SMTA.

How can the optimal test method be found? An answer to this question is given by Ebeid Safein in his lecture "In-Circuit or Functional Test: Why test at all?

He introduces the methods of in-circuit and functional testing, discusses the advantages and disadvantages and uses various examples to show when which test strategy is the right one and how the two test methods can be combined.

The lecture is a cooperation with BarTron Inc. who represents Digitaltest on the North American continent in the states of Michigan, Ohio and Pennsylvania.

The online event will take place on February 9th at 1:30 PM PST, more information about the event and registration can be found here.

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