When it comes to the test coverage of a program in the analog ICT, the question is not only whether there is a test for every component and if it was performed, but also whether the test would in fact recognize a fault.
To check this we have developed the FailSim tool for the AMU05. This prevents so-called pseudo-tests.
FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.