Events Exhibitions News Company

Enthused visitors at APEX

This year‘s IPC APEX Expo in San Diego was a total success! Our on-site team was gratified by the constantly well-attended Digitaltest booth. Visitors...

Events Webinars

FailSim Webinar – Ascertain What Your Test Will Actually Cover

FailSim is a product that can be considered a strategy to make sure that you test your products properly so that no errors are made and quality can be...

Events Exhibitions Press

Digitaltest exhibiting at the APEX SHOW 2018

On this year's APEX Show we will be demonstrating our latest flying probe solutions with a new camera system, new modules to improve the test quality...

Press Exhibitions Company

Not at Productronica 2017 – Now Digitaltest is doing it differently!

For the first time in over 20 years Digitaltest GmbH will not be exhibiting at Productronica in Munich. Managing Director Hans Baka answers critical...

Webinars

User-Webinar Condor Flying Probe

In this webinar you will learn about the latest Condor flying probe innovations and its new camera system.

Webinars

User-Webinar Application

In this webinar you will learn about how our new Design Verification Service can help with the design for testability (DFT) verification of your pcb,...

Meetings Exhibitions Press

Digitaltest at the Nordic Test Forum 2017

Digitaltest is invited as a speaker at the Nordic Test Forum on the 28th and 29th November 2017.

Webinars

User-Webinar Software

In this webinar you will learn how the C-LINK Software can help you to select alternative test points and the possibilities of how you can use the CAD...

Webinars Events

Webinar: Software in electronic manufacturing (Industry 4.0)

In the webinar, you will learn more about the various software solutions in electronics manufacturing and how they can help you prepare and monitor...

Webinars Events

Webinar: Flying Prober can be economical for any type of production

Learn how to benefit from the flexibility of a flying prober, how to speed up test time, increasing test coverage and test depth.

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