With the boundary scan upgrade to our Flying Probe the needles can act as virtual JTAT/Boundary Scan cells. This increases fault coverage, since now the conductor paths that otherwise could not be reached can also be tested.
Shortens test times as well as time-to-market
Enables very high fault coverage even for highly compact flat modules
Incorporates all functions in CITE – production remains in the familiar user interface
Simple data export with C-LINK for boundary scan software
Fast system diagnostics for error conditions
All JTAG/Boundary Scan test and programming procedures can be reused